infoTECH Feature

September 04, 2009

Accel-RF Unveils High Power RF Automated Accelerated Reliability Test System for GaN Devices

Accel-RF reportedly announced the new high power RF automated accelerated reliability test system that will help manufacturers prove reliability for application specific devices. HiPR-AARTS is an addition to its family of RF Reliability Test System Products.
 
The RF Automated Accelerated Reliability Test Station systems are designed to stress devices with RF, DC, and thermal stimulus.  The systems were designed from their inception to include RF stimulus - it was not added as an after-thought.  Hence, the software and hardware are fully integrated and provide full-featured support. 
 
Manufacturers are using Accel-RF’s equipment to prove intrinsic reliability and performance degradation characteristics of GaN technology on discrete devices and lower power MMICs. The next stage in the development of the technology is to build and test high power devices for use in radar and military and communication electronics.
 
“As reliability is proven on lower powered devices, the technology evolution is moving toward high power GaN, MMICs, HEMT and HFET devices that require significant advancements in reliability testing equipment,” said Roland Shaw, president and founder of Accel-RF, in a statement.
 
The new system is either liquid or air cooled, has RF and DC pulsing capability, and can handle device power dissipation of up to 200 watts each.
 
“This new system can manage over seven times more power than our current generation product,” Shaw said. “This capability allows our customers to life test their products at channel temperatures in excess of 300 degrees Celsius, with performance characterization at normal operating temperature levels.”
 
“In addition to our customers, compound semiconductor manufacturers, specifically Wide Band-Gap initiative partners and Tri-Services component teams are currently pushing the capabilities of our existing products,” Shaw said. “Our new High Power RF Reliability Test System will give our customers plenty of capability to prove reliability of new technology in real-life conditions now and into the future, and Accel-RF is ready to supply this leading-edge equipment worldwide.”

Follow ITEXPO (News - Alert) on Twitter: twitter.com/itexpo

Anamika Singh is a contributing editor for TMCnet. To read more of Anamika's articles, please visit her columnist page.

Edited by Amy Tierney
FOLLOW US

Subscribe to InfoTECH Spotlight eNews

InfoTECH Spotlight eNews delivers the latest news impacting technology in the IT industry each week. Sign up to receive FREE breaking news today!
FREE eNewsletter

infoTECH Whitepapers