infoTECH Feature

May 30, 2013

AMD Selects OptimalTest as Primary Test Management Solution Supplier

OptimalTest, a major player in enterprise-wide test management solutions, has been selected by AMD (News - Alert) as its primary test management solution supplier. As part of a multi-year agreement, the two companies will closely collaborate on solutions for improving yield, quality and utilization across their global supply chain facilities and on all of their factory testers.

Industry experts opined that technology agreement will drive significant ROI through various capabilities.  In fact, the OptimalEnterprise Solution Suite delivers a powerful, comprehensive and scalable set of applications to meet the test management needs of global and/or distributed semiconductor enterprises.

"At AMD, we are focused on continuous improvements that optimize our global supply chain for speed, efficiency and cost," said John Docherty, senior vice president, Global Operations, AMD, in a statement. "With the data management and analysis capabilities of OptimalEnterprise, we were able to achieve significant improvements in product yield and quality in our pilot project and, as a result, we are now deploying this solution across our entire supply chain."

"We are delighted to work with AMD and help them establish an optimized solution for their global manufacturing supply chain," added Dan Glotter, CEO and president of OptimalTest. "With AMD's adoption of OptimalEnterprise, we are continuing to expand the reach of our Global Semiconductor Information Highway by providing semiconductor companies with the ability to streamline their supply chain to improve product yield, quality and utilization."

In related company news, recently OptimalTest revealed that Marvell (News - Alert) has agreed to use its Test Management Software Solution to expand the implementation of OptimalTest solutions throughout Marvell's organization and global supply chain.

This decision came after the successful completion of a pilot project using OptimalTest's solutions, in which Marvell realized significant results in yield and utilization. The worldwide implementation includes both wafer sort and final test operations.




Edited by Jamie Epstein
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