OptimalTest, a company that deals in enterprise-wide test management solutions, recently announced that its Test Management Software Solution is being deployed by Marvell (News - Alert) to expand the implementation of OptimalTest solutions throughout Marvell's organization and global supply chain.
The solution delivers a scalable set of applications and capabilities to meet the test management needs of global and/or distributed semiconductor enterprises. Already installed and in use at the leading Fabless semiconductor organizations globally, this solution facilitates more effective supply chain collaboration, and provides visibility and timely actionable data, for improved decision-making and better overall results.
"We are delighted to partner with Marvell, one of the top semiconductor companies and a global force in the industry, as they continue to adopt the Optimal Enterprise solution worldwide and across their entire fleet of testers," said Dan Glotter, CEO and president of OptimalTest. "Forward-looking companies like Marvell now realize that test management solutions are key to gaining significant, not just incremental, improvements in their test operations."
OptimalTest provides test management software solutions incorporating Advanced Adaptive Test techniques that deliver strong ROI through significant improvements in yield, test time reduction, reliability and quality as well as reduced cost of test.
"With the OT toolset, we were able to collect and analyze data concerning equipment utilization and yield losses as a result of equipment malfunctions and implement corrective actions immediately. We concluded that in order to more tightly manage our supply chain, we had to execute a full enterprise implementation of the toolset," said Dr. Albert Wu, vice president of operations at Marvell Semiconductor, Inc.
Recently, OptimalTest, Ness Ziona, Israel, has been assigned a patent (8,421,494) developed by Gil Balog, Jerusalem, Reed Linde, El Dorado Hills, Calif., and Avi Golan, Tel Aviv, Israel, for "systems and methods for test time outlier detection and correction in integrated circuit testing."