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December 21, 2012

Agilent Announces Latest Release of IC-CAP

Agilent Technologies (News - Alert) recently released a new version of the Integrated Circuit Characterization and Analysis Program (IC-CAP), the company’s device modeling software platform.

The new features in IC-CAP 2013.01 make it ideal for high-frequency device modeling.

In addition to the new Gallium nitride (GaN) extraction package, the new Python programming environment and the extension of the PNA-X driver to nonlinear measurements, IC-CAP 2013.01 brings an array of other new features, such as support for the Smartspice simulator and for National Instrument interfaces and cards on the LINUX platform.

IC-CAP WaferPro, a powerful automated on-wafer measurement solution, now features new usability and user interface enhancements to facilitate test plan development. IC-CAP DataPro adds batch processing capability to automate automated multi-size devices analysis.

Agilent’s IC-CAP Angelov-GaN Extraction Package, the software add-on, provides a dedicated environment that enables users to perform the necessary measurements and extraction of the Angelov-GaN model. The software supports DC and S-parameter measurements and de-embedding.

A turnkey extraction flow is provided as a starting extraction procedure and the flow can be fully customized. Simulations are performed using Agilent’s Advanced Design System (ADS).

"As the leading provider of RF device characterization and modeling, Agilent continues to make bold improvements to our IC-CAP product," said Roberto Tinti, device modeling product manager with Agilent EEsof EDA. "This release represents a major milestone, as Python greatly improves an engineer's ability to learn and get the most out of IC-CAP. We continue to lead the way in high-frequency modeling with our Angelov-GaN extraction package."

Meanwhile, Agilent recently introduced the industry's first eMMC (embedded multimedia card) compliance test application for embedded storage solutions. The Agilent N6465A eMMC test application helps memory design engineers validate and debug eMMC NAND flash memory cards faster by automating the execution of a series of parametric tests, including electrical and timing measurements, on Agilent Infiniium 9000, 90000A, 90000 X- and 90000 Q-Series oscilloscopes.

Want to learn more about the latest in communications and technology? Then be sure to attend ITEXPO Miami 2013, Jan 29- Feb. 1 in Miami, Florida.  Stay in touch with everything happening at ITEXPO (News - Alert). Follow us on Twitter.

Edited by Braden Becker

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