infoTECH Feature

July 09, 2013

Advantest Unveils T5831 System for Testing Next-Generation ICs

The Advantest Corporation (News - Alert) has made available the latest T5831 system, ideal for testing future generation ICs used in mobile applications, to its customers. The ICs include NAND Flash with high-speed ONFi or Toggle Mode interfaces and managed NAND devices like embedded multi-media cards or eMMC. Simultaneous testing of both NAND Flash and mobile DRAM in a multi-chip package or MCP is also supported by this adaptable tester.

Parallel testing is facilitated by the T5831's design, which also offers the needed functionality at an affordable price. The current testing requirements are addressed by this affordable solution, which can also be upgraded to expand customers' return on investment for potential needs. The supplementary engineering solution, T5831 ES, is perfect for test program development and device categorization, thereby enhancing customers' overall time to market.

The best test time for NAND Flash is facilitated by the numerous main features of the system. High throughput is guaranteed by the system’s Tester-Per-Site architecture. The system’s best-in-class device power supply current per DUT accelerates programming and erasing operations. Real-time analysis of error-correcting codes or ECC can be carried out by tester hardware, thereby getting rid of all test time outlays related with post-processing.

In a statement, Masuhiro Yamada, executive vice president of memory test for Advantest Corporation, said, "This new test solution delivers the performance that our customers need today in a modular design with the extendibility to meet tomorrow's changing test requirements. The T5831 extends Advantest's leadership in the ATE market and will add to our worldwide installed base of more than 8,000 memory test systems."

Apart from maximizing output, instantaneous source-synchronous functionality enhances throughput when compared with conventional post-processing methods. Cycle-by-cycle adjustments are automatically done by the system to allow for timing drifts due to differences in process-voltage-temperature or PVT and jitter. Data-eye precision for the most favorable output at high speeds is therefore guaranteed. The tester also supports crucial functions like block administration, redundancy analysis and custom/random data creation. The T5831 is therefore the perfect tester for all NAND Flash testing requirements.




Edited by Rich Steeves
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