The popularity of smartphones and tablet PCs have led to an increase in the production of devices. Innovative methods to accelerate the development cycles are being identified by manufacturers, thereby resolving issues related to manufacturing capacity. An innovative JOT M10 Functional Test Solution, a descendent of JOT Multi Level Tester, will assist manufacturers in addressing these issues. The well-appreciated JOT Multi Level Tester is one of the widely used computerized production test solutions for mobile devices.
Manufacturers will be able to carry out board/PCB-level functional testing, flashing and RF-tuning of smart devices using the extremely efficient, scalable and modular JOT M10 Functional Test Solution. These devices will include mobile phones, smartphones, tablet computers, PCs and computers, motherboards, automotive electronics, or fundamentally any electronics product with finest production quality needs.
One test solution can now be used right from R&D up to production, ensuring safe, competent and rapid production ramp up. The solution’s modular system architecture allows the M10 to effortlessly acclimatize to production volume disparities during a product's life cycle, and among the production lines and factories.
M10 Test Boxes, M10 Test Rack, and M10 Test Handler are included in the JOT M10 Functional Test Solution. The M10 Test Boxes have been incorporated with test electronics. These Test Boxes are compatible with module and panel-level testing, and are offered in RF and non-RF versions.
M10 Test Boxes can be housed along with third-party test instruments on a M10 Test Rack, in a production setting. The M10 Test Rack with Test Boxes can be either served physically or mechanically using the M10 Test Handler. An option to split the test phases, both inside the rack and between the racks, is available for ensuring highest-possible capacity.
The M10 is ideal for an assortment of test strategies, processes, end products and applications, making it a reliable investment for manufacturers. Several handset manufacturers, chipset manufacturers and test instrument manufacturers have already enquired regarding the JOT M10 Functional Test Solution, even before the actual launch. A few chosen clients are currently using a beta version of the solution. The solution will be unveiled at the APEX Exhibition, scheduled in February 2013 in San Diego.
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