Agilent (News - Alert) Technologies Inc., a company that deals in chemical analysis, life sciences, diagnostics, electronics and communications, recently launched Agilent M9381A, which the officials say is the world’s fastest vector signal generator in a PXI form factor.
The Agilent M9381A is the modular signal generator you’ve been asking for – one that provides Agilent quality and performance in the PXI form factor. It accelerates throughput by delivering new levels of speed in signal generation – fast RF tuning, baseband tuning technology innovation, versatile list mode, and more.
A typical M9381A configuration includes four individual PXIe modules – M9311A digital vector modulator, M9310A source output, M9301A synthesizer, and the M9300A frequency reference – designed for fast data interfaces and high-speed automated test systems.
Instrument control is provided through a soft front panel and programmatic interfaces tuned to your application and development environment of choice.
“The M9381A is the first PXI vector signal generator that delivers the speed and accuracy needed to reduce the cost of test in modern communication manufacturing,” said Mark Pierpoint, vice president and general manager of Agilent’s Software and Modular Solutions Division.
Meanwhile, Agilent Technologies (News - Alert) recently introduced PCI Express 3.0 receiver test calibration and transmitter test software, which provides an integrated environment for calibrating the stressed voltage and stressed receiver eye using an Agilent J-BERT bit error-ratio tester, an Agilent 90000A-, Q- or X-Series oscilloscope, an Agilent pulse function generator and Agilent PCI (News - Alert) Express 3.0 calibration test channels.
Agilent N5393C Option 004 PCI Express 3.0 receiver test calibration software provides a receiver signal calibration test suite that allows engineers to set up a J-BERT N4903B bit error-ratio tester for performing PCI Express 3.0 jitter tolerance testing under the PCIe 3.0 Base specification, the company said.
By automating the calibration of the bit error-ratio test signal, engineers save test time and achieve a consistent stressed eye signal, ensuring their PCIe 3.0 devices meet the requirements of the specification for jitter and voltage stress levels.
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