Agilent Technologies unveils new device modeling software platform
Dec 28, 2012 (Datamonitor via COMTEX) --
Agilent Technologies Inc., a provider of technology solutions, has announced the latest release of its device modeling software platform, the Integrated Circuit Characterization and Analysis Program, or IC-CAP.
With IC-CAP 2013.01, Agilent introduces major improvements to its product for device modeling. One key improvement is extraction of the Angelov-GaN model, the industry standard compact device model for GaN semiconductor devices, the company said.
Agilent's W8533 Angelov-GaN extraction package provides a software environment that allows users to perform the necessary measurements and extraction of the Angelov-GaN model. Typical DC and network analyzers are supported for making DC and S-parameter measurements and de-embedding.
An interface lets users execute a step-by-step extraction flow to obtain the model parameters. A flow provides quick start modeling of GaN devices. The package also enables complete customization to optimize the flow to different technology flavors of GaN processes. Simulations are performed using Agilent's Advanced Design System.
IC-CAP 2013.01 also features a new Python programming environment for typical tasks such as parameter extraction, data analysis, instrument control and interface responsiveness. It enables better code organization and provides an extensive set of libraries for math, instrument control and statistical analysis.
"As the leading provider of RF device characterization and modeling, Agilent continues to make bold improvements to our IC-CAP product," said Roberto Tinti, device modeling product manager with Agilent EEsof EDA.
"This release represents a major milestone, as Python greatly improves an engineer's ability to learn and get the most out of IC-CAP. We continue to lead the way in high-frequency modeling with our Angelov-GaN extraction package."
Other new features in IC-CAP 2013 .01 include support of Smartspice simulations and support for gain compression and two-tone intermodulation distortion measurements with Agilent's PNA-X network analyzer.
Another part of the platform, IC-CAP WaferPro (a powerful automated on-wafer measurement solution), now features usability and user interface enhancements to facilitate test-plan development, the company added.
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