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Samsung and PDF Solutions(r) to Collaborate to Enhance PDF Solutions' YieldAware(tm) Fault Detection and Classification Solution(GlobeNewswire Via Acquire Media NewsEdge) SAN JOSE, Calif., April 28, 2009 (GLOBE NEWSWIRE) -- PDF Solutions, Inc. (Nasdaq:PDFS), the leading provider of yield improvement technologies and services for the IC manufacturing process life cycle, today announced that it is collaborating with Samsung Electronics Corporation to further the enhancement of PDF Solutions' YieldAware(tm) Fault Detection and Classification (YA-FDC) solution. The improved YA-FDC solution is intended to reduce process variability in Samsung's fabs by controlling process tool health with models that predict the impact of tool sensor signals on final product yield. "We are very impressed with the YA-FDC solution that controls the undesirable factors of process tools by modeling fab-wide FDC signals with product yield, and we appreciate the opportunity to further the development of an improved system with PDF Solutions, one of the world's leading commercial providers of yield enhancement solutions," stated Dr. CS Choi, Executive Vice President of System LSI Division, Samsung Electronics. "We look forward to enhancements to the current system for tool management, as well as reductions in process variability due to the tool variations at leading-edge technology nodes." "We are pleased to work with Samsung to extend the industry's only comprehensive system to model the impact of FDC signals on product yield and performance," stated David Joseph, Chief Strategy Office of PDF Solutions. "The integrated offering is designed to tie tool parameter data with product yield information to improve product performance and reduce the cost of good die. The YA-FDC solution creates models that predict future product results from current wafer-by-wafer tool signals. Our work with Samsung is intended to help reduce variability in Samsung's high volume fabs running its most advanced products." About YA-FDC PDF Solutions' YA-FDC solution combines FDC, metrology, inspection, PCM and product test data into an analysis and modeling environment for creation of product-relevant models to be used in real-time, tool-level decision making. About PDF Solutions PDF Solutions, Inc. (Nasdaq:PDFS) is the leading provider of yield improvement technologies and services for the IC manufacturing process life cycle. PDF Solutions offers solutions that are designed to enable clients to lower costs of IC design and manufacture, enhance time to market, and improve profitability by addressing design and manufacturing interactions from product design to initial process ramps to mature manufacturing operations. PDF Solutions' Characterization Vehicle(r) (CV(r)) test chips provide the core modeling capabilities, and are used by more leading manufacturers than any other test chips in the industry. PDF Solutions' industry leading yield management system software, dataPOWER(r), and fault detection and classification software, maestria(r), enhance yield improvement and production control activities at leading fabs around the world. Headquartered in San Jose, Calif., PDF Solutions operates worldwide with additional offices in China, Europe, Japan, Korea, Singapore, and Taiwan. For the company's latest news and information, visit http://www.pdf.com/. The PDF Solutions, Inc. logo is available at //www.globenewswire.com/newsroom/prs/?pkgid=3199 Characterization Vehicle, CV, dataPOWER, maestria, pdBRIX, PDF Solutions, and the PDF Solutions logo are trademarks of PDF Solutions, Inc. CONTACT: PDF Solutions, Inc. Jim Jensen, Vice President, Volume Manufacturing Solutions (408) 938-6434 [email protected] Sonia Segovia, Investor Relations Coordinator (408) 938-6491 [email protected] 2009 GlobeNewswire, Inc. |